Rev. Sci. Inst. 69 (1998) 2964-2973

A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source
T. Warwick, K. Franck, J. B. Kortright, G. Meigs, M. Moronne, S. Myneni, E. Rotenberg, S. Seal, and W. F. Steele
Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720
H. Ade and A. Garcia
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695
S. Cerasari
Universitá di Trieste, 134127 Trieste, Italy
J. Denlinger
University of Michigan, Ann Arbor, Michigan 48109
S. Hayakawa
School of Engineering, University of Tokyo, Tokyo 113, Japan
A. P. Hitchcock and T. Tyliszczak
Department of Chemistry, McMaster University, Hamilton, Ontario L8S 4M1, Canada
J. Kikuma
ASAHI Chemical Industry Co., Fuji shi 416, Japan
E. G. Rightor
DOW Chemical, Midland, Michigan 48641
H.-J. Shin
Pohang Accelerator Laboratory, POSTECH, Pohang 790784, Korea
B. P. Tonner
Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211

(Received 23 April 1998; accepted for publication 26 May 1998)

Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.

ã 1998 American Institute of Physics. [S0034-6748(98)04908-9]