Soft X-ray Spectromicroscopy Beamline
Beamline Specifications
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SOURCE: insertion device - an Elliptically Polarized Undulator (EPU)
capable of fully rotatable linear as well as elliptically polarized light.
OPTICS: A plane or spherical grating with input and refocussing mirrors.
The STXM focuses the soft X-ray light with a Fresnel zone plate.
PHOTON RANGE: |
6 to 60 (100) Å or |
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250 (100) to 1900 eV |
PHOTON FLUX: |
Pre-Zone Plate: 1014 in 50 micron. |
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Post-Zone Plate: 108 in 50 nm. |
RESOLUTION: E/DE = 8000.
CAPABILITIES
(i) Scanning Transmission X-ray Microscope (STXM): Imaging, XAFS, Microspectroscopy
(NEXAFS), operate in non-UHV environment, including liquids and ambient
air.
(ii) Photoelectron Emission Microscopy (PEEM): Imaging, Microscopy,
EXAFS, NEXAFS, operates in UHV only.
(iii) An absorption/ionization gas cell, for order filtering and for
beam diagnostics. |