B.Sc. (Queen's); M.Sc. (Queen's)
Location: ABB 332
Phone: +1 905 525-9140 ext. 24864
FAX: +1 905 521-2773
RESEARCH: Semiconductor surface passivation by in-situ and ex-situ techniques is studied by a combination of synchrotron methods (X-ray absorption (XANES, EXAFS) and X-ray standing wave) and lab-based UHV methods (LEED, Auger, thermal desorption).
Since 15-Feb-02, I am working as a staff scientist with the Interface and Surface Analysis group at the University of Toronto. I hope to defend my PhD by the end of this year.
© 2002 A.P. Hitchcock / McMaster University
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