Contact Info

Adam P. Hitchcock

Canada Research Chair

in Materials Research
CLS-CCRS
B.I.M.R
McMaster University
Hamilton, ON
Canada L8S 4M1
V: +1 905 525-9140
    x24729
F: +1 905 521-2773
E: aph@mcmaster.ca
U: unicorn.mcmaster.ca
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X-ray Microscopy and Atomic Force Microscopy of PS-PMMA blends

WHO:  Adam Hitchcock, Cynthia Morin, BIMR, McMaster University;
              Harald Ade, NCSU
 
WHERE:  Advanced Light Source  BL 7.0  Scanning Transmission X-ray Microscope (STXM)
 
WHEN:   October 2000  POSTED:  04 Dec 2000 (update 15-Apr-02)
 
WHAT:  Phase segregation in copolymer blends of polystyrene (PS) and polymethylmethacrylate (PMMA) has been studied using Scanning Transmission X-Ray Microscopy (STXM) to probe the bulk structure, and Photoemission Electron Microscopy (PEEM) to probe surface structure. Chemical maps of a 60+/-5 nm thin film of a 30:70 (w/w) PS-PMMA blend have been derived from PEEM and STXM C 1s image sequences. These are compared to atomic force microscopy (AFM) height and phase images in the figure. Both PEEM and STXM indicate the continuous phase is PS, not the majority PMMA component. The evolution of the bulk with annealing is clearly visualized by STXM.
 
RFERENCE: Morin et al. J. Eelctron Spectrosc. 121 (2001) 203

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web site by Christopher Amis. Last updated on 04/23/2002 (aph)